For citations:
Yavkin B.V., Soltamov V.A., Murzakhanov F.F., Mamin G.V., Mokhov E.N., Goovaerts E. Broadening of the silicon vacancy EPR line in SiC revealed through optically selective excitation. Magnetic Resonance in Solids. 2024;26(2):24218 (7 pp.). https://doi.org/10.26907/mrsej-24218
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